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Domů Produkty Inspekce, měření a testování Rentgeny microme|x neo/nanome|x neo

microme|x neo/nanome|x neo

The phoenix microme|x neo and nanome|x neo provide high resolution 2D X-ray technology and 3D computed tomography( CT) scanning in one system, enabling non-destructive testing (NDT) of electronic components – such as semiconductors, pcba’s, lithium-ion batteries -- in industrial, automotive, aviation and consumer electronics industries.

With innovative engineering coupled with ultra high positioning accuracy, phoenix microme|x neo and nanome|x neo are ideally suited for industrial X-ray electronics inspections in process and quality control, failure analysis and R&D.
Baker Hughes
Unique features
  • Automated inspection in micrometer range with easy to program CAD based μAXI
  • Active cooling for high dynamic, live imaging at 180 kV configurations
  • Brilliant live imaging and fast data acquisition for 3D CT / planarCT scanning with:
  • 30 frames per second with GE’s highly dynamic DXR flat panel detector
  • Up to 2 times faster data acquisition at same high image quality level with diamond|window
  • Option provided for 3D CT scans within up to 10 seconds
Industry-leading detail detectability speed & image quality
  • Brilliant live inspection images with high dynamic GE DXR digital detector array
  • Large 27” monitor and ultra-high defect coverage and repeatability
  • Detail detectability at 0.5 µm or 0.2 µm with nanofocus
  • Live overlay of CAD and inspection results even in rotated oblique inspection views
  • High power 180 kV / 20 W micro- or nanofocus tube for high absorbing electronic samples
Efficient and transportable for in-field use
  • Minimized setup time due to highly efficient automated CAD programming
  • Designed for portability with compact, state-of-the-art electronics
  • Intuitive GUI interface with fully automated inspection program generation
Options for optimization and 3D scanning
  • Optional FLASH!™ image optimization technology
  • Optional advanced failure analysis with high resolution 3D micro- or nanoCT® or large 
  • board planarCT
  • Optional 3D CT scans up to 10 seconds
Bc. Daniel Striček obchodní zástupce (CT, rentgeny, osazování)
mobil
+420 724 890 087
telefon
+420 571 669 349
email
d.stricek%a-t%pbt.cz

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Baker Hughes
  • Novinka
microme|x neo/nanome|x neo