Phoenix V|tome|x S Neo
CT platform for high-resolution 2D radiography, 3D microCT, optional nanoCT® and dimensional measurement. It combines dual-tube flexibility, configurable detector performance and a compact footprint of just over 3 m² for seamless integration into laboratory and quality-control environments.
Phoenix V|tome|x S Neo is designed for applications ranging from fine-detail analysis of small parts to inspection of denser, medium-sized components. The system combines high-detail inspection, broad application flexibility and everyday usability in a compact industrial CT platform.
The Dual|tube configuration allows users to switch between a 240 kV / 320 W microfocus X-ray tube and an optional 180 kV / 20 W nanofocus X-ray tube with Diamond|window technology. Switching between penetration and precision is possible at the push of a button without recalibration.
With detail detectability below 1 µm with the microfocus tube and down to 0.2 µm with the optional nanofocus tube, V|tome|x S Neo supports demanding inspection applications in electronics, batteries, aerospace, medical devices, additive manufacturing and other industries.
The system offers a flexible detector lineup, allowing the configuration to be optimized for everyday inspection, higher throughput or high-resolution CT. Available detectors include the DXR S100 Pro, the fast Dynamic 41|200, and the high-resolution Dynamic 41|100 with 16 MP resolution, 100 µm pixel size and a dynamic range greater than 10,000:1.
Proprietary High|Flux target technology together with high-sensitivity detectors enables superior image quality at significantly reduced scan times. For larger parts, optional Offset|CT supports scan diameters up to 400 mm.
The optional Metrology|edition extends inspection into dimensional measurement according to VDI/VDE 2630. It supports nominal-actual CAD comparison, wall thickness analysis and reverse engineering, with verification using Ruby|plate and Easy|calib.
Data acquisition and reconstruction are handled by Datos|x 3, Waygate Technologies’ CT software platform. It provides an intuitive interface and up to 40% faster reconstruction, with advanced modules such as Fast|scan and Sector|scan for complex high-resolution inspection tasks.