phoenix v|tome|x s

he v|tome|x s is a versatile high-resolution system for 2D X-ray inspection and 3D computed tomography (micro ct and nano ct) and 3D metrology.

To allow high flexibility, the v|tome|x s may be equipped with a 180 kV/15 W high-power nanofocus X-ray tube and a 240 kV/320 W microfocus tube. Due to this unique combination, the CT system is a very effective and reliable tool for a wide range of applications from extreme high-resolution scans of low absorbing materials as well as for 3D analysis of high absorbing objects.
  • Unique open nanofocus-microfocus dual tube combination possible (180 kV / 15 W high-power nanofocus X-ray tube and 240 kV / 320 W microfocus tube)
  • Up to 10 times increased filament lifetime, ensuring long-term stability and optimizing system efficiency by long-life|filament (optionally)
  • Up to 2 times faster data acquisition at the same high image quality level by diamond|window (optionally)
  • Optional offset|scan und helix|scan capability for maximized scan flexibility
  • Fast CT acquisition and brilliant live images by high dynamic temperature-stabilized GE DXR digital detector with 30 fps (frames per second) (optionally)
  • 3D Metrology package for dimensional measuring with extremely high precision, reproducibility and user-friendliness
  • The new GE high-flux|target makes CT scanning more efficient due to up to 2 times faster microCT scans or doubled resolution.
  • Automated generation of first article inspection reports in < 1 hour possible
Daniel Striček Sales Manager
(X-Ray, CT, SMT P&P equipment)
mobile
+420 724 890 087
phone
+420 571 669 349
email
d.stricek%a-t%pbt.cz

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